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Naval Surface Warfare Center Crane Hosts Workshop for New EO/IR Sensor

Multi-target visibility

Naval Surface Warfare Center Crane Hosts Workshop for New EO/IR Sensor

Naval Surface Warfare Center Crane Division organized a workshop from May 10 to 11 for Multi-SpecTral High-Resolution Imaging and Targeting Sensor, an effort to develop maritime electro-optical/infrared capabilities to expand visibility over multiple targets. According to Office of Naval Research Program Officer Benjamin Conley, the program will also enable long-range situational awareness and targeting.

Conley, who is also the senior scientist and technology manager for EO/IR sensing at NSWC Crane, explained that MUST-HITS detects multiple targets at the same time using an infrared resolution sensor with a digital backend. He added that the sensor’s digital attribute allows it to be upgradeable without needing major hardware upgrades.

Meanwhile, Joshua Borneman, MUST-HITS’ principal investigator and NSWC Crane’s electro-optics chief scientist, noted that the camera technology being developed under the program could have various EO/IR applications.

MUST-HITS is a future naval capability backed by ONR and executed by Lockheed Martin, Senseeker Engineering, HRL Laboratories and Cyan Systems, NSWC Crane said.

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Category: Defense and Intelligence

Tags: Benjamin Conley Defense and Intelligence electro optical infrared Multi-Spectral High Resolution Imaging and Targeting Sensor MUST-HITS Naval Surface Warfare Center Crane Office of Naval Research